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Articles 301 - 305 of 305
Full-Text Articles in Engineering
Investigation Of The Optical Properties Of Ordered Semiconductor Materials, Jack E. Mccrae Jr.
Investigation Of The Optical Properties Of Ordered Semiconductor Materials, Jack E. Mccrae Jr.
Theses and Dissertations
Optical studies have been conducted upon CdGeAs2 and ZnGeP2, two of the most promising semiconductors being developed for mid-infrared non-linear optics applications. These experiments included photoluminescence (PL) studies of both compounds as well as photoreflectance (PR) measurements upon CdGeAs2. In addition, Hall effect measurements were carried out upon CdGeAs2, to aid in interpretation of the optical data. PL was measured as a function of laser power, sample temperature, and crystal orientation for CdGeAs2. One broad weak peak near 0.38 eV, and another somewhat narrower and often far brighter peak near 0.57 …
Measurement Of The Spectral Functions Of Vector Current Hadronic Tau Decays, R. Barate, M. Thulasidas
Measurement Of The Spectral Functions Of Vector Current Hadronic Tau Decays, R. Barate, M. Thulasidas
Research Collection School Of Computing and Information Systems
A measurement of the spectral functions of non-strange τ vector current final states is presented, using 124 358 τ pairs recorded by the ALEPH detector at LEP during the years 1991 to 1994. The spectral functions of the dominant two- and four-pion τ decay channels are compared to published results of e + e - annihilation experiments via isospin rotation. A combined fit of the pion form factor from τ decays and e + e - data is performed using different parametrizations. The mass and the width of the ρ ±(770) and the ρ 0(770) are separately determined in order …
Constraint Satisfaction Methods For Generating Valid Cuts, John Hooker
Constraint Satisfaction Methods For Generating Valid Cuts, John Hooker
John Hooker
No abstract provided.
Computer System For Simulating Physical Processes Using Multiple Integer State Vectors Us:5594671, Hudong Chen, Peter Churchill, Robert Iannucci, Kim Molvig, Gregory Papadopoulos, Stephen Remondi, Christopher Teixeira, Kenneth Traub
Computer System For Simulating Physical Processes Using Multiple Integer State Vectors Us:5594671, Hudong Chen, Peter Churchill, Robert Iannucci, Kim Molvig, Gregory Papadopoulos, Stephen Remondi, Christopher Teixeira, Kenneth Traub
Robert A Iannucci
No abstract provided.
Direct Measurement Of Diffuse Double-Layer Forces At The Semiconductor/Electrolyte Interface Using An Atomic Force Microscope, Kai Hu, Fu-Ren F. Fan, Allen J. Bard, Andrew C. Hillier
Direct Measurement Of Diffuse Double-Layer Forces At The Semiconductor/Electrolyte Interface Using An Atomic Force Microscope, Kai Hu, Fu-Ren F. Fan, Allen J. Bard, Andrew C. Hillier
Andrew C. Hillier
The forces between a silica probe and an n-type TiO2 single-crystal electrode were measured using an atomic force microscope in an aqueous electrolyte solution. These interactions were a strong function of the solution pH, the presence of specifically adsorbed anions, and the TiO2 electrode potential. For a series of pH values, a strong electrostatic repulsion was seen at high pH and decreased as the pH was reduced. At pH values below 5.5, the interaction became attractive. A series of force measurements between SiO2 and n-type TiO2 showed a repulsive interaction when TiO2 was held at negative electrode potentials, which transformed …