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Graphene Used As A Lateral Force Microscopy Calibration Material In The Low-Load Non-Linear Regime, Mathias J. Boland, Jacob L. Hempel, Armin Ansary, Mohsen Nasseri, Douglas R. Strachan

Physics and Astronomy Faculty Publications

A lateral force microscopy (LFM) calibration technique utilizing a random low-profile surface is proposed that is successfully employed in the low-load non-linear frictional regime using a single layer of graphene on a supporting oxide substrate. This calibration at low loads and on low friction surfaces like graphene has the benefit of helping to limit the wear of the LFM tip during the calibration procedure. Moreover, the low-profiles of the calibration surface characteristic of these layered 2D materials, on standard polished oxide substrates, result in a nearly constant frictional, adhesive, and elastic response as the tip slides over the surface, making …