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Measurement Of The Hall Coefficient And Electron Mobility Using Van Der Pauw Type Hall Effect Measurements, Hong-Sheng Luo
Measurement Of The Hall Coefficient And Electron Mobility Using Van Der Pauw Type Hall Effect Measurements, Hong-Sheng Luo
Theses
Hall effect measurement in the electrical characterization of semiconductor materials is very important. We set up the Hall effect measurement system and examined the system with a standard sample. The experimental results show that this Hall measurement system worked as well as expected. We also used this system to study the GaAs/GaAs and InGaAs/GaAs which grown by MBE. Finally, we disscussed and consided some common problems of Hall measurement. Some useful formulas and plots are presented.