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Topic-Guided Conversational Recommender In Multiple Domains, Lizi Liao, Ryuichi Takanobu, Yunshan Ma, Xun Yang, Minlie Huang, Tat-Seng Chua May 2022

Topic-Guided Conversational Recommender In Multiple Domains, Lizi Liao, Ryuichi Takanobu, Yunshan Ma, Xun Yang, Minlie Huang, Tat-Seng Chua

Research Collection School Of Computing and Information Systems

Conversational systems have recently attracted significant attention. Both the research community and industry believe that it will exert huge impact on human-computer interaction, and specifically, the IR/RecSys community has begun to explore Conversational Recommendation. In real-life scenarios, such systems are often urgently needed in helping users accomplishing different tasks under various situations. However, existing works still face several shortcomings: (1) Most efforts are largely confined in single task setting. They fall short of hands in handling tasks across domains. (2) Aside from soliciting user preference from dialogue history, a conversational recommender naturally has access to the back-end data structure which …


Just-In-Time Defect Identification And Localization: A Two-Phase Framework, Meng Yan, Xin Xia, Yuanrui Fan, Ahmed E. Hassan, David Lo, Shanping Li Jan 2022

Just-In-Time Defect Identification And Localization: A Two-Phase Framework, Meng Yan, Xin Xia, Yuanrui Fan, Ahmed E. Hassan, David Lo, Shanping Li

Research Collection School Of Computing and Information Systems

Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one challenging task is: whether we can locate buggy program prior to appearance of the defect symptom at an early time (e.g., when buggy program elements are being checked-in). We refer to this type of defect localization as “Just-In-Time (JIT) Defect localization”. Although many prior studies have proposed various JIT defect identification methods to identify …