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Full-Text Articles in Physical Sciences and Mathematics
Microstructural And Compositional Analysis Of Strontium-Doped Lead Zirconate Titanate Thin Films On Gold-Coated Silicon Substrates, S Sriram, M Bhaskaran, D Rg Mitchell, K T. Short, A Holland, A Mitchell
Microstructural And Compositional Analysis Of Strontium-Doped Lead Zirconate Titanate Thin Films On Gold-Coated Silicon Substrates, S Sriram, M Bhaskaran, D Rg Mitchell, K T. Short, A Holland, A Mitchell
Australian Institute for Innovative Materials - Papers
This article discusses the results of transmission electron microscopy ~TEM!-based characterization of strontium-doped lead zirconate titanate ~PSZT! thin films. The thin films were deposited by radio frequency magnetron sputtering at 3008C on gold-coated silicon substrates, which used a 15 nm titanium adhesion layer between the 150 nm thick gold film and ~100! silicon. The TEM analysis was carried out using a combination of high-resolution imaging, energy filtered imaging, energy dispersive X-ray ~EDX! analysis, and hollow cone illumination. At the interface between the PSZT films and gold, an amorphous silicon-rich layer ~about 4 nm thick! was observed, with the film composition …
Nanocolumnar Preferentially Oriented Pszt Thin Films Deposited On Thermally Grown Silicon Dioxide, S Sriram, M Bhaskaran, A Mitchell, D Rg Mitchell, G Kostovski
Nanocolumnar Preferentially Oriented Pszt Thin Films Deposited On Thermally Grown Silicon Dioxide, S Sriram, M Bhaskaran, A Mitchell, D Rg Mitchell, G Kostovski
Australian Institute for Innovative Materials - Papers
We report the first instance of deposition of preferentially oriented, nanocrystalline, and nanocolumnar strontium-doped lead zirconate titanate (PSZT) ferroelectric thin films directly on thermal silicon dioxide. No intermediate seed or activation layers were used between PSZT and silicon dioxide. The deposited thin films have been characterised using a combination of diffraction and microscopy techniques.