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Synchrotron X-Ray Diffraction Of Layering Transitions Of Multilayer Nitrogen Physisorbed On Graphite, T. E. Burns, John R. Dennison, S. N. Ehrlich

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We use synchrotron x-ray diffraction for structural analysis of the behavior of multilayer nitrogen films physisorbed on graphite foam. We provide structural information and concentrations of 2D and 3D solid phases at a coverage of Θ = 8 ML (Θ / 1 ML for a %3 x %3 structure) for temperatures from below the bulk α-ß transition temperature [T_α-ß = 34 " 0.5 K] to above the bulk triple point [T_tp = 63 K]. Our data indicate layering begins near T_α-ß, with subsequent layering occurring as the temperature is raised; all bulk nitrogen forms disordered film …