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Full-Text Articles in Physical Sciences and Mathematics
Dual-Mode Sequential Logic For Function Independent Fault-Testing, Sumit Dasgupta, Carlos R.P. Hartmann, Luther D. Rudolph
Dual-Mode Sequential Logic For Function Independent Fault-Testing, Sumit Dasgupta, Carlos R.P. Hartmann, Luther D. Rudolph
Electrical Engineering and Computer Science - Technical Reports
This paper presents a method of using hardware redundancy to ease the problem of fault testing in sequential logic networks. Sequential logic networks are constructed using two kinds of dual-mode logic gates, one of which is specifically required to initialize a feedback loop to some logic value. Initially, it is shown that these networks can be tested for all single stuck-at-faults with six function-independent tests. Next, this method is generalized to detect large classes of multiple faults with six function-independent tests. In both cases, the network must have the proper number of extra inputs.
Dual-Mode Combinational Logic For Function-Independent Fault Testing, Sumit Dasgupta
Dual-Mode Combinational Logic For Function-Independent Fault Testing, Sumit Dasgupta
Electrical Engineering and Computer Science - Technical Reports
This paper presents a method of using hardware redundancy to ease the problem of fault testing in combinational logic networks. Combinational logic networks are constructed using dual-mode logic gates. Initially, it is shown that these networks can be tested for all single stuck-at-faults using just two function-independent tests. This method is then extended to detect a large class of multiple faults with the same two function-independent tests.