Physical Sciences and Mathematics Commons^™

Just-In-Time Defect Identification And Localization: A Two-Phase Framework, Meng Yan, Xin Xia, Yuanrui Fan, Ahmed E. Hassan, David Lo, Shanping Li

Research Collection School Of Computing and Information Systems

Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one challenging task is: whether we can locate buggy program prior to appearance of the defect symptom at an early time (e.g., when buggy program elements are being checked-in). We refer to this type of defect localization as “Just-In-Time (JIT) Defect localization”. Although many prior studies have proposed various JIT defect identification methods to identify …