Open Access. Powered by Scholars. Published by Universities.®
Physical Sciences and Mathematics Commons™
Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 2 of 2
Full-Text Articles in Physical Sciences and Mathematics
An Empirical Study Of Classifier Combination On Cross-Project Defect Prediction, Yun Zhang, David Lo, Xin Xia, Jianling Sun
An Empirical Study Of Classifier Combination On Cross-Project Defect Prediction, Yun Zhang, David Lo, Xin Xia, Jianling Sun
Research Collection School Of Computing and Information Systems
To help developers better allocate testing and debugging efforts, many software defect prediction techniques have been proposed in the literature. These techniques can be used to predict classes that are more likely to be buggy based on past history of buggy classes. These techniques work well as long as a sufficient amount of data is available to train a prediction model. However, there is rarely enough training data for new software projects. To deal with this problem, cross-project defect prediction, which transfers a prediction model trained using data from one project to another, has been proposed and is regarded as …
Evaluating Defect Prediction Using A Massive Set Of Metrics, Xiao Xuan, David Lo, Xin Xia, Yuan Tian
Evaluating Defect Prediction Using A Massive Set Of Metrics, Xiao Xuan, David Lo, Xin Xia, Yuan Tian
Research Collection School Of Computing and Information Systems
To evaluate the performance of a within-project defect prediction approach, people normally use precision, recall, and F-measure scores. However, in machine learning literature, there are a large number of evaluation metrics to evaluate the performance of an algorithm, (e.g., Matthews Correlation Coefficient, G-means, etc.), and these metrics evaluate an approach from different aspects. In this paper, we investigate the performance of within-project defect prediction approaches on a large number of evaluation metrics. We choose 6 state-of-the-art approaches including naive Bayes, decision tree, logistic regression, kNN, random forest and Bayesian network which are widely used in defect prediction literature. And we …