Open Access. Powered by Scholars. Published by Universities.®
Physical Sciences and Mathematics Commons™
Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 2 of 2
Full-Text Articles in Physical Sciences and Mathematics
Atomic Force Microscopy Of Poly(Ethylane-Oxide) Crystalization, Xavier Capaldi
Atomic Force Microscopy Of Poly(Ethylane-Oxide) Crystalization, Xavier Capaldi
Honors Theses
Polymer crystallization is a complex process which is influenced by a variety of factors. Atomic force microscopy is used to explore the material properties of polymer crystals. Poly(ethylene-oxide) is used in a variety of molecular weights as the sample. In addition, a variety of sample preparation methods and microscopy modes were tested. A relatively new imaging technique was identified for the characterization of polymer crystals: amplitude modulation-frequency modulation viscoelastic mapping. This mode was used to measure material properties such as stiffness and dissipation.
Direction Of Lead Diffusion In Geological Samples Using Rutherford Backscattering Sepctrometry, Andrew Mccalmont
Direction Of Lead Diffusion In Geological Samples Using Rutherford Backscattering Sepctrometry, Andrew Mccalmont
Honors Theses
A Rutherford Backscattering (RBS) analysis experiment was performed on several pyrrhotite samples in order to understand their lead (Pb) diffusive properties and determine the diffusion coefficients for Pb into the sample. The pyrrhotite samples were prepared at Rensselaer Polytechnic Institute and were subsequently annealed for one to several days at temperatures on the order of 500–800℃. A 1.1–MV Pelletron Accelerator in the Union College Ion Beam Analysis Laboratory was used to produce beams of 3.3–MeV alpha particles. The beam of alpha particles collided with the samples and the backscattered alpha particles’ energies were detected using a silicon surface barrier detector. …