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Full-Text Articles in Physical Sciences and Mathematics
Effect Of Z1/2, Eh5, And Ci1 Deep Defects On The Performance Of N-Type 4h-Sic Epitaxial Layers Schottky Detectors: Alpha Spectroscopy And Deep Level Transient Spectroscopy Studies, M. A. Mannan, S. K. Chaudhuri, K. V. Nguyen, K. C. Mandal
Effect Of Z1/2, Eh5, And Ci1 Deep Defects On The Performance Of N-Type 4h-Sic Epitaxial Layers Schottky Detectors: Alpha Spectroscopy And Deep Level Transient Spectroscopy Studies, M. A. Mannan, S. K. Chaudhuri, K. V. Nguyen, K. C. Mandal
Faculty Publications
No abstract provided.
Scanning Capacitance Spectroscopy On N+-P Asymmetrical Junctions In Multicrystalline Si Solar Cells, Chun-Sheng Jiang, Jennifer T. Heath, Helio R. Moutinho, Mowafak M. Al-Jassim
Scanning Capacitance Spectroscopy On N+-P Asymmetrical Junctions In Multicrystalline Si Solar Cells, Chun-Sheng Jiang, Jennifer T. Heath, Helio R. Moutinho, Mowafak M. Al-Jassim
Faculty Publications
We report on a scanning capacitance spectroscopy (SCS) study on the n+-p junction of multicrystalline silicon solar cells. We found that the spectra taken at space intervals of ∼10 nm exhibit characteristic features that depend strongly on the location relative to the junction. The capacitance-voltage spectra exhibit a local minimum capacitance value at the electrical junction, which allows the junction to be identified with ∼10-nm resolution. The spectra also show complicated transitions from the junction to the n-region with two local capacitance minima on the capacitance-voltage curves; similar spectra to that have not been previously reported in …
Measurement Of Thin Liquid Film Drainage Using A Novel High-Speed Impedance Analyzer, K. O. Hool, R. C. Saunders, Harry J. Ploehn
Measurement Of Thin Liquid Film Drainage Using A Novel High-Speed Impedance Analyzer, K. O. Hool, R. C. Saunders, Harry J. Ploehn
Faculty Publications
This work describes the design and implementation of a new instrument, called the thin film impedance analyzer, which measures the rate of drainage of thin oil films. The instrument forms an oil film by elevating a planar oil–water interface into a water drop hanging from a stainless steel capillary tube immersed in the oil. The instrument measures the magnitude of the impedance of the matter between the capillary tube and a screen electrode immersed in the lower water phase. Under appropriate conditions, the capacitance of the oil film dominates the impedance. The instrument records the increase in the magnitude of …