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Full-Text Articles in Physical Sciences and Mathematics
Deep Traps In Algan/Gan Heterostructures Studied By Deep Level Transient Spectroscopy: Effect Of Carbon Concentration In Gan Buffer Layers, Z-Q. Fang, B. Claflin, David C. Look, D. S. Green, R. Vetury
Deep Traps In Algan/Gan Heterostructures Studied By Deep Level Transient Spectroscopy: Effect Of Carbon Concentration In Gan Buffer Layers, Z-Q. Fang, B. Claflin, David C. Look, D. S. Green, R. Vetury
Physics Faculty Publications
Electrical properties, including leakage currents, threshold voltages, and deep traps, of AlGaN/GaN heterostructure wafers with different concentrations of carbon in the GaN buffer layer, have been investigated by temperature dependent current-voltage and capacitance-voltage measurements and deep level transient spectroscopy (DLTS), using Schottky barrier diodes (SBDs). It is found that (i) SBDs fabricated on the wafers with GaN buffer layers containing a low concentration of carbon (low-[C] SBD) or a high concentration of carbon (high-[C] SBD) have similar low leakage currents even at 500 K; and (ii) the low-[C] SBD exhibits a larger (negative) threshold voltage than the high-[C] SBD. Detailed …
Structural Investigations And Magnetic Properties Of Sol-Gel Ni0.5zn0.5fe2o4 Thin Films For Microwave Heating, Pengzhao Z. Gao, Evgeny V. Rebrov, Tiny M. W. G. M. Verhoeven, Jaap C. Schouten, Richard Kleismit, Gregory Kozlowski, John S. Cetnar, Zafer Turgut, Guru Subramanyam
Structural Investigations And Magnetic Properties Of Sol-Gel Ni0.5zn0.5fe2o4 Thin Films For Microwave Heating, Pengzhao Z. Gao, Evgeny V. Rebrov, Tiny M. W. G. M. Verhoeven, Jaap C. Schouten, Richard Kleismit, Gregory Kozlowski, John S. Cetnar, Zafer Turgut, Guru Subramanyam
Physics Faculty Publications
Nanocrystalline Ni0.5Zn0.5Fe2O4 thin films have been synthesized with various grain sizes by a sol-gel method on polycrystalline silicon substrates. The morphology, magnetic, and microwave absorption properties of the films calcined in the 673–1073 K range were studied with x-ray diffraction, scanning electron microscopy, x-ray photoelectron spectroscopy, atomic force microscopy, vibrating sample magnetometry, and evanescent microwave microscopy. All films were uniform without microcracks. Increasing the calcination temperature from 873 to 1073 K and time from 1 to 3 h resulted in an increase of the grain size from 12 to 27 nm. The saturation …