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High-Resolution Near-Field Raman Microscopy Of Single-Walled Carbon Nanotubes, Achim Hartschuh, X. Sunney Xie, Lukas Novotny, Erik J. Sánchez
High-Resolution Near-Field Raman Microscopy Of Single-Walled Carbon Nanotubes, Achim Hartschuh, X. Sunney Xie, Lukas Novotny, Erik J. Sánchez
Physics Faculty Publications and Presentations
We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of approximately 25 nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.