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Physical Sciences and Mathematics Commons

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Physics

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TÜBİTAK

2014

Thin films

Articles 1 - 2 of 2

Full-Text Articles in Physical Sciences and Mathematics

Influence Of Composition On The Structure And Optoelectronic Properties Of Pb_Xin_{25-X}Se_{75} Thin Films, Hesham Azmi Elmeleegi, Zeinab El Sayed El Mandouh, Ahmed Abdel Moez Jan 2014

Influence Of Composition On The Structure And Optoelectronic Properties Of Pb_Xin_{25-X}Se_{75} Thin Films, Hesham Azmi Elmeleegi, Zeinab El Sayed El Mandouh, Ahmed Abdel Moez

Turkish Journal of Physics

Pb_xIn_{25-x}Se_{75} thin films with 2 compositions were prepared by thermal evaporation. The surface topography of these films was studied by transmission electron microscope. The optical reflectance and transmittance were studied in order to determine the optical parameters such as optical energy gap, refractive index, extinction coefficient, dielectric loss, and dielectric tangent loss for these films. A single oscillator theory equation was applied for these films in order to determine both dispersion energy and oscillating energy, and the ratio of free carrier concentration/effective mass (N/m*) was determined optically. It was found that change in the composition of these films affects strongly …


An Investigation On Silar Deposited Cu_Xs Thin Films, Aykut Astam, Yunus Akaltun, Muhammet Yildirim Jan 2014

An Investigation On Silar Deposited Cu_Xs Thin Films, Aykut Astam, Yunus Akaltun, Muhammet Yildirim

Turkish Journal of Physics

A copper sulfide thin film was deposited on glass substrate by successive ionic layer adsorption and reaction method at room temperature, using cupric sulfate and sodium sulfide aqueous solutions as precursors. The structural, surface morphological, optical, and electrical properties of the as-deposited film were investigated via X-ray diffraction, scanning electron microscopy, energy dispersive X-ray analysis, optical absorption, and d.c. 2-point probe methods. The film was found to be amorphous, dense, and uniform. Average atomic percentage of Cu:S in the as-deposited film was calculated as 63:37. The band gap energy of copper sulfide thin film was found to be 2.14 eV …