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Physical Sciences and Mathematics Commons

Open Access. Powered by Scholars. Published by Universities.®

Engineering

University of Wollongong

Series

2005

Using

Articles 1 - 2 of 2

Full-Text Articles in Physical Sciences and Mathematics

Ybco Coated Conductor Using Biaxially Textured Clad Composite Ni-Mn/Ni-Cr Substrate, D Q. Shi, S X. Dou, R. K. Ko, J K. Chung, H S. Kim, H S. Ha, K J. Song, C. Park Jan 2005

Ybco Coated Conductor Using Biaxially Textured Clad Composite Ni-Mn/Ni-Cr Substrate, D Q. Shi, S X. Dou, R. K. Ko, J K. Chung, H S. Kim, H S. Ha, K J. Song, C. Park

Australian Institute for Innovative Materials - Papers

A new biaxially textured composite tape of Ni–4.5% Mn/Ni–1.5% Cr was used as a substrate for a YBCO coated conductor through the RABiTS approach. Multi-layer CeO2/YSZ/Y2O3 buffer layers and YBCO film were deposited on the substrate by pulsed laser deposition. The deposition conditions of the buffer layers and the YBCO were studied and compared. Good biaxial textures have been obtained for buffer layers on composite Ni–4.5% Mn/Ni–1.5% Cr substrates. Scanning electron microscopy on sample cross-sections was used to examine the interface and diffusion of oxygen. The uniform formation of an Ni–Mn–O layer between NiO and …


Off-Axis Mgb2 Films Using An In Situ Annealing Pulsed Laser Deposition Method, Yue Zhao, Mihail Ionescu, Josip Horvat, S X. Dou Jan 2005

Off-Axis Mgb2 Films Using An In Situ Annealing Pulsed Laser Deposition Method, Yue Zhao, Mihail Ionescu, Josip Horvat, S X. Dou

Australian Institute for Innovative Materials - Papers

Highly smooth and c-axis oriented superconducting MgB2 thin films were prepared by pulsed laser deposition (PLD) with off-axis geometry. The films were deposited on Al2O3–C substrates perpendicularly aligned to a stoichiometric MgB2 target in a 120 mTorr high purity Ar background gas. An in situ annealing was carried out at 650 °C for 1 min in a 760 Torr Ar atmosphere. Despite the short annealing time, an x-ray θ–2θ scan shows fairly good crystallization, according to the clear c-axis oriented peaks for the films. Both atomic force microscopy and the x-ray diffraction …