Physical Sciences and Mathematics Commons^™

Test Generation By Fault Sampling, Vishwani Agrawal, Hassan Farhat, Sharad C. Seth

Mathematics Faculty Publications

This paper presents a novel technique of generating tests from a random sample of faults. The entire fault population of the circuit is randomly divided into two groups. Only one group, usually the smaller one, is used for test generation by the test-generator and fault-simulator programs. This group is known as the sample and its coverage is deterministic. The coverage of faults in the remaining group is similar to that of random vectors and is estimated from the distribution of fault detection probabilities in the circuit. As the sample size increases, the fraction of unsampled faults reduces. At the same …