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Physical Sciences and Mathematics Commons™
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Full-Text Articles in Physical Sciences and Mathematics
Considerations For Radio Frequency Fingerprinting Across Multiple Frequency Channels, Jose A. Gutierrez Del Arroyo, Brett J. Borghetti, Michael A. Temple
Considerations For Radio Frequency Fingerprinting Across Multiple Frequency Channels, Jose A. Gutierrez Del Arroyo, Brett J. Borghetti, Michael A. Temple
Faculty Publications
Radio Frequency Fingerprinting (RFF) is often proposed as an authentication mechanism for wireless device security, but application of existing techniques in multi-channel scenarios is limited because prior models were created and evaluated using bursts from a single frequency channel without considering the effects of multi-channel operation. Our research evaluated the multi-channel performance of four single-channel models with increasing complexity, to include a simple discriminant analysis model and three neural networks. Performance characterization using the multi-class Matthews Correlation Coefficient (MCC) revealed that using frequency channels other than those used to train the models can lead to a deterioration in performance from …
Defect Detection In Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning, Philip Cho, Aihua W. Wood, Krishnamurthy Mahalingam, Kurt Eyink
Defect Detection In Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning, Philip Cho, Aihua W. Wood, Krishnamurthy Mahalingam, Kurt Eyink
Faculty Publications
Point defects play a fundamental role in the discovery of new materials due to their strong influence on material properties and behavior. At present, imaging techniques based on transmission electron microscopy (TEM) are widely employed for characterizing point defects in materials. However, current methods for defect detection predominantly involve visual inspection of TEM images, which is laborious and poses difficulties in materials where defect related contrast is weak or ambiguous. Recent efforts to develop machine learning methods for the detection of point defects in TEM images have focused on supervised methods that require labeled training data that is generated via …