Open Access. Powered by Scholars. Published by Universities.®
Physical Sciences and Mathematics Commons™
Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 1 of 1
Full-Text Articles in Physical Sciences and Mathematics
A Unified Solution To Scan Test Volume, Time, And Power Minimization, Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya
A Unified Solution To Scan Test Volume, Time, And Power Minimization, Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya
CSE Conference and Workshop Papers
The double-tree scan-path architecture, originally proposed for low test power, is adapted to simultaneously reduce the test application time and test data volume under external testing. Experimental results show significant performance improvements over other existing scan architectures.