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Full-Text Articles in Physical Sciences and Mathematics
Xanes In (Tmtsef)2re04: Polarization Dependence Of The Se K-Edge, Juana Acrivos
Xanes In (Tmtsef)2re04: Polarization Dependence Of The Se K-Edge, Juana Acrivos
Faculty Publications, Chemistry
We have measured XANES (X-ray Absorption Near Edge Spectra) near the Re Li(i=l,II,III) edges in (TMTTF)2Re04 and (TMTSeF)2Re04 and the Se K edge in the latter compound. An important dependence of the XANES at the Se K edge on the polarization of the incident beam with respect to the crystal axes was observed, whose interpretation can give information on the symmetry of the unoccupied conduction band states. The positions of the Re L edges were compared with those in several .inorganic compounds containing Re in various oxidation states, and were found to be, within experimental error, the same as those …
The Impact Of Solid State Science In Our Society, Juana Acrivos
The Impact Of Solid State Science In Our Society, Juana Acrivos
Faculty Publications, Chemistry
No abstract provided.
Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin
Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin
Faculty Publications, Chemistry
Standard reference markers for accurate, reproducible synchrotron x-ray energies are obtained using a three Si crystal spectrometer. The first two crystals are in the monochromator and the third is used to obtain diffraction markers which monitor the energy. Then for any value of the glancing angle on the reference Si crystal the energy for the (333) diffraction must occur at 3/4 that of the (444) and 3/5 of that for the (555). This establishes for the first time an absolute synchrotron energy scale. Higher-order diffractions are used to determine excitation line profiles. We conclude that the use of reference diffractions …
Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin
Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin
Juana Vivó Acrivos
Standard reference markers for accurate, reproducible synchrotron x-ray energies are obtained using a three Si crystal spectrometer. The first two crystals are in the monochromator and the third is used to obtain diffraction markers which monitor the energy. Then for any value of the glancing angle on the reference Si crystal the energy for the (333) diffraction must occur at 3/4 that of the (444) and 3/5 of that for the (555). This establishes for the first time an absolute synchrotron energy scale. Higher-order diffractions are used to determine excitation line profiles. We conclude that the use of reference diffractions …