Physical Sciences and Mathematics Commons^™

Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin

Juana Vivó Acrivos

Standard reference markers for accurate, reproducible synchrotron x-ray energies are obtained using a three Si crystal spectrometer. The first two crystals are in the monochromator and the third is used to obtain diffraction markers which monitor the energy. Then for any value of the glancing angle on the reference Si crystal the energy for the (333) diffraction must occur at 3/4 that of the (444) and 3/5 of that for the (555). This establishes for the first time an absolute synchrotron energy scale. Higher-order diffractions are used to determine excitation line profiles. We conclude that the use of reference diffractions …