Physical Sciences and Mathematics Commons^™

Oscillator Strengths Of The Si Ii 181 Nanometer Resonance Multiplet, Scott D. Bergeson, J. E. Lawler

Faculty Publications

We report Si II experimental log (gf)-values of –2.38(4) for the 180.801 nm line, of –2.18(4) for the 181.693 nm line, and of –3.29(5) for the 181.745 nm line, where the number in parenthesis is the uncertainty in the last digit. The overall uncertainties (~10%) include the 1 σ random uncertainty (~6%) and an estimate of the systematic uncertainty. The oscillator strengths are determined by combining branching fractions and radiative lifetimes. The branching fractions are measured using standard spectroradiometry on an optically thin source; the radiative lifetimes are measured using time-resolved laser-induced fluorescence.