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Monte Carlo Simulations Of Dna Damage From Incorporated Cold Iodine Following Photoelectrically Induced Auger Electron Cascades, V. Moiseenko, S. Karnas, E. Yu, J. Battista
Monte Carlo Simulations Of Dna Damage From Incorporated Cold Iodine Following Photoelectrically Induced Auger Electron Cascades, V. Moiseenko, S. Karnas, E. Yu, J. Battista
Edward Yu
Radiation-induced damage in nucleosomal DNA from Auger electron cascades due to incorporated cold IUdR has been modelled through Monte Carlo simulations. Probabilities of DNA double strand break (DSB) production following a vacancy in the K, L, M and N shells of iodine are estimated. DSB complexity from the base damage accompanying a break was also estimated. Multiple DSB events were analysed for correlated breaks due to nucleosome periodicity. The probability of an Auger cascade causing at least one DSB strongly depended on the shell in which the initial vacancy was produced. This probability was approximately 0.35 for K and L …