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Scanning Microscopy

Journal

1989

Scanning Electron Microscope

Articles 1 - 3 of 3

Full-Text Articles in Life Sciences

Quantitative Evaluation Of Scanning Electron Microscopy-Examined Ciliary Morphological Changes In Control And Noise Exposed Guinea Pig Cochleas, S. Rydmarker, P. Nilsson, D. E. Dunn, C. Lindqvist Dec 1989

Quantitative Evaluation Of Scanning Electron Microscopy-Examined Ciliary Morphological Changes In Control And Noise Exposed Guinea Pig Cochleas, S. Rydmarker, P. Nilsson, D. E. Dunn, C. Lindqvist

Scanning Microscopy

Many investigations of noise-induced hearing loss have demonstrated a poor correlation between hearing threshold and hair cell loss. One reason for this is that more subtle changes in the hair cell, such as detailed morphological changes of stereocilia, have not been evaluated. However, examining such changes increases the problem of distinguishing experimental pathological changes from artefacts. Preparation of the specimen for scanning electron microscopy (SEM) may result in too many artefacts for an adequate quantification of defects due to noise exposure.

One problem with some earlier studies seems to be lack of controls and/or statistical analysis for the purpose of …


Scanning Electron Microscope-Based Metrological Electron Microscope System And New Prototype Scanning Electron Microscope Magnification Standard, Michael T. Postek Nov 1989

Scanning Electron Microscope-Based Metrological Electron Microscope System And New Prototype Scanning Electron Microscope Magnification Standard, Michael T. Postek

Scanning Microscopy

A metrological electron microscope has been developed at the National Institute of Standards and Technology (NIST) traceable to national standards of length, and a new prototype magnification standard meeting the current needs of the scanning electron microscope (SEM) user community has been fabricated. This metrology instrument is designed to certify standards for the calibration of the magnification of the SEM and for the certification of artifacts for linewidth measurement done in the SEM. The artifacts will be useful for various applications in which the SEM is currently being used. The SEM-based metrology system is now operational at the Institute, and …


Design And Applications Of In-Situ Differential Scanning Electron Microscopy, A. Sicignano, M. Vaez Iravani Feb 1989

Design And Applications Of In-Situ Differential Scanning Electron Microscopy, A. Sicignano, M. Vaez Iravani

Scanning Microscopy

Contrast enhancement in the scanning electron microscope (SEM) is usually achieved by either of the two techniques of black level suppression, and differential imaging. This paper is mainly concerned with the latter method. Differential imaging of SEM images is commonly accomplished by either using a selective electronic filtering circuit (time sensitive) on the video signals, or the post processing of a collected digitized image (application of special kernel operatives). A technique is described that is capable of generating true in-situ SEM differential video signals of local sample features. Characteristics of this method are enhanced sample feature-boundary sensitivity, suppression of large …