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Full-Text Articles in Engineering
Optical Response Of Bifeo3 Films Subjected To Uniaxial Strain, Andrew Herklotz, Stefania Rus, Changhee Sohn, Santosh Kc, Valentino Cooper, Er-Jia Guo, Thomas Ward
Optical Response Of Bifeo3 Films Subjected To Uniaxial Strain, Andrew Herklotz, Stefania Rus, Changhee Sohn, Santosh Kc, Valentino Cooper, Er-Jia Guo, Thomas Ward
Faculty Publications
The impact of single-axis lattice expansion on the optical response of BiFeO3 films is examined. Low-energy He implantation is used to tailor morphotropic phases of BiFeO3 films and study changes in their optical spectra with continuously increasing lattice expansion. He ion implantation of epitaxial rhombohedral (R)- and tetragonal (T)-like BiFeO3 films induces uniaxial out-of-plane strain that, on R-like films, eventually leads to a complete R-T phase transition. This approach allows us to provide insights into the optical response of BiFeO3 films. Strain doping of T-like films leads to a significant redshift of the optical absorption spectra that is theoretically explained …
Non-Conventional Mechanism Of Ferroelectric Fatigue Via Cation Migration, Anton Ievlev, Santosh Kc, Rama Vasudevan, Yunseok Kim, Xiaoli Lu, Marin Alexe, Valentino Cooper, Sergei Kalinin, Olga Ovchinnikova
Non-Conventional Mechanism Of Ferroelectric Fatigue Via Cation Migration, Anton Ievlev, Santosh Kc, Rama Vasudevan, Yunseok Kim, Xiaoli Lu, Marin Alexe, Valentino Cooper, Sergei Kalinin, Olga Ovchinnikova
Faculty Publications
The unique properties of ferroelectric materials enable a plethora of applications, which are hindered by the phenomenon known as ferroelectric fatigue that leads to the degradation of ferroelectric properties with polarization cycling. Multiple microscopic models explaining fatigue have been suggested; however, the chemical origins remain poorly understood. Here, we utilize multimodal chemical imaging that combines atomic force microscopy with time-of-flight secondary mass spectrometry to explore the chemical phenomena associated with fatigue in PbZr0.2Ti0.8O3 (PZT) thin films. Investigations reveal that the degradation of ferroelectric properties is correlated with a local chemical change and migration of electrode ions into the PZT structure. …