Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 2 of 2
Full-Text Articles in Engineering
Utilizing A Real Life Data Warehouse To Develop Freeway Travel Time Eliability Stochastic Models, Emam Emam
Utilizing A Real Life Data Warehouse To Develop Freeway Travel Time Eliability Stochastic Models, Emam Emam
Electronic Theses and Dissertations
During the 20th century, transportation programs were focused on the development of the basic infrastructure for the transportation networks. In the 21st century, the focus has shifted to management and operations of these networks. Transportation network reliability measure plays an important role in judging the performance of the transportation system and in evaluating the impact of new Intelligent Transportation Systems (ITS) deployment. The measurement of transportation network travel time reliability is imperative for providing travelers with accurate route guidance information. It can be applied to generate the shortest path (or alternative paths) connecting the origins and destinations especially under conditions …
Study Of Nanoscale Cmos Device And Circuit Reliability, Chuanzhao Yu
Study Of Nanoscale Cmos Device And Circuit Reliability, Chuanzhao Yu
Electronic Theses and Dissertations
The development of semiconductor technology has led to the significant scaling of the transistor dimensions -The transistor gate length drops down to tens of nanometers and the gate oxide thickness to 1 nm. In the future several years, the deep submicron devices will dominate the semiconductor industry for the high transistor density and the corresponding performance enhancement. For these devices, the reliability issues are the first concern for the commercialization. The major reliability issues caused by voltage and/or temperature stress are gate oxide breakdown (BD), hot carrier effects (HCs), and negative bias temperature instability (NBTI). They become even more important …