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Full-Text Articles in Engineering

Modeling The Influences Of Personality Preferences On The Selection Of Instructional Strategies Inintelligent Tutoring Systems, Robert Sottilare Jan 2006

Modeling The Influences Of Personality Preferences On The Selection Of Instructional Strategies Inintelligent Tutoring Systems, Robert Sottilare

Electronic Theses and Dissertations

This thesis hypothesizes that a method for selecting instructional strategies (specifically media) based in part on a relationship between learning style preference and personality preference provides more relevant and understandable feedback to students and thereby higher learning effectiveness. This research investigates whether personality preferences are valid predictors of learning style preferences. Since learning style preferences are a key consideration in instructional strategies and instructional strategies are a key consideration in learning effectiveness, this thesis contributes to a greater understanding of the relationship between personality preferences and effective learning in intelligent tutoring systems (ITS). This research attempts to contribute to the …


A Three-Dimensional Bay/Estuary Model To Simulate Water Quality Transport, Jing Yu Jan 2006

A Three-Dimensional Bay/Estuary Model To Simulate Water Quality Transport, Jing Yu

Electronic Theses and Dissertations

This thesis presents the development of a numerical water quality model using a general paradigm of reaction-based approaches. In a reaction-based approach, all conceptualized biogeochemical processes are transformed into a reaction network. Through the decomposition of species governing equations via Gauss-Jordan column reduction of the reaction network, (1) redundant fast reactions and irrelevant kinetic reactions are removed from the system, which alleviates the problem of unnecessary and erroneous formulation and parameterization of these reactions, and (2) fast reactions and slow reactions are decoupled, which enables robust numerical integrations. The system of species transport equations is transformed to reaction-extent transport equations, …


Study Of Nanoscale Cmos Device And Circuit Reliability, Chuanzhao Yu Jan 2006

Study Of Nanoscale Cmos Device And Circuit Reliability, Chuanzhao Yu

Electronic Theses and Dissertations

The development of semiconductor technology has led to the significant scaling of the transistor dimensions -The transistor gate length drops down to tens of nanometers and the gate oxide thickness to 1 nm. In the future several years, the deep submicron devices will dominate the semiconductor industry for the high transistor density and the corresponding performance enhancement. For these devices, the reliability issues are the first concern for the commercialization. The major reliability issues caused by voltage and/or temperature stress are gate oxide breakdown (BD), hot carrier effects (HCs), and negative bias temperature instability (NBTI). They become even more important …