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[Delta] Iddq Testing Of A Cmos 12-Bit Charge Scaling Digital-To-Analog Converter, Kalyan Madhav Golla
[Delta] Iddq Testing Of A Cmos 12-Bit Charge Scaling Digital-To-Analog Converter, Kalyan Madhav Golla
LSU Master's Theses
This work presents design, implementation and test of a built-in current sensor (BICS) for ∆IDDQ testing of a CMOS 12-bit charge scaling digital-to-analog converter (DAC). The sensor uses power discharge method for the fault detection. The sensor operates in two modes, the test mode and the normal mode. In the test mode, the BICS is connected to the circuit under test (CUT) which is DAC and detects abnormal currents caused by manufacturing defects. In the normal mode, BICS is isolated from the CUT. The BICS is integrated with the DAC and is implemented in a 0.5 μm n-well CMOS technology. …