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Contactless Thermally Stimulated Lifetime Measurements In Detector-Grade Cadmium Zinc Telluride, Royal Kessick, Gary Tepper, Ed Lee, Ralph James

Chemical and Life Science Engineering Publications

Contactless thermally stimulated lifetime measurements were performed on detector-grade Cd_1−xZn_xTe (x∼0.1) crystals using a pulsed lasermicrowavecavityperturbation method. The carrier lifetime decreased from approximately 30 μs at 110 K to 4 μs at 160 K, and then remained relatively constant from 160 to 300 K. The sudden drop in carrier lifetime within a particular temperature range is consistent with the thermal activation of a charge trap with a detrapping time longer than the carrier lifetime. The maximum trap activation temperature and the minimum detrapping time are estimated from the lifetime versus temperature curve to be approximately 160 …