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Training Set Design For Test Removal Classication In Ic Test, Nagarjun Hassan Ranganath

Dissertations and Theses

This thesis reports the performance of a simple classifier as a function of its training data set. The classifier is used to remove analog tests and is named the Test Removal Classifier (TRC).

The thesis proposes seven different training data set designs that vary by the number of wafers in the data set, the source of the wafers and the replacement scheme of the wafers. The training data set size ranges from a single wafer to a maximum of five wafers. Three of the training data sets include wafers from the Lot Under Test (LUT). The training wafers in the …