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Analog Implicit Functional Testing Using Supervised Machine Learning, Neerja Pramod Bawaskar

Dissertations and Theses

Testing analog circuits is more difficult than digital circuits. The reasons for this difficulty include continuous time and amplitude signals, lack of well-accepted testing techniques and time and cost required for its realization. The traditional method for testing analog circuits involves measuring all the performance parameters and comparing the measured parameters with the limits of the data-sheet specifications. Because of the large number of data-sheet specifications, the test generation and application requires long test times and expensive test equipment.

This thesis proposes an implicit functional testing technique for analog circuits that can be easily implemented in BIST circuitry. The proposed …