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Full-Text Articles in Engineering
Integrated Circuit Wear-Out Prediction And Recycling Detection Using Radio-Frequency Distinct Native Attribute Features, Randall D. Deppensmith
Integrated Circuit Wear-Out Prediction And Recycling Detection Using Radio-Frequency Distinct Native Attribute Features, Randall D. Deppensmith
Theses and Dissertations
Radio Frequency Distinct Native Attribute (RF-DNA) has shown promise for detecting differences in Integrated Circuits(IC) using features extracted from a devices Unintentional Radio Emissions (URE). This ability of RF-DNA relies upon process variation imparted to a semiconductor device during manufacturing. However, internal components in modern ICs electronically age and wear out over their operational lifetime. RF-DNA techniques are adopted from prior work and applied to MSP430 URE to address the following research goals: 1) Does device wear-out impact RF-DNA device discriminability?, 2) Can device age be continuously estimated by monitoring changes in RF-DNA features?, and 3) Can device age state …
Electromagnetic Characterization Of Materials Using A Dual Chambered High Temperature Waveguide, Jeffrey S. Sovern
Electromagnetic Characterization Of Materials Using A Dual Chambered High Temperature Waveguide, Jeffrey S. Sovern
Theses and Dissertations
Measurement of the electromagnetic properties of materials at high temperatures is important for industrial, scientific, medical, and aerospace applications [1]. Current high-temperature electromagnetic material characterization is a time consuming process that typically requires three days to collect data from one material specimen. For example, the standard high-temperature process involving rectangular waveguides [2] requires measurements of the sample (1), the empty waveguide (2), and a metal short standard (3) completed in separate heated runs over three days to perform the Nicolson-Ross-Weir inversion algorithm for computing permittivity and permeability. The technique developed here will reduce the high-temperature measurement process from three days …