Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 3 of 3
Full-Text Articles in Engineering
Method For Determining Time-Resolved Heat Transfer Coefficient And Adiabatic Effectiveness Waveforms With Unsteady Film Cooling, James L. Rutledge, Jonathan F. Mccall
Method For Determining Time-Resolved Heat Transfer Coefficient And Adiabatic Effectiveness Waveforms With Unsteady Film Cooling, James L. Rutledge, Jonathan F. Mccall
AFIT Patents
A new method for determining heat transfer coefficient (h) and adiabatic effectiveness (η) waveforms h(t) and η(t) from a single test uses a novel inverse heat transfer methodology to use surface temperature histories obtained using prior art approaches to approximate the h(t) and η(t) waveforms. The method best curve fits the data to a pair of truncated Fourier series.
Improved Sensitivity Mems Cantilever Sensor For Terahertz Photoacoustic Spectroscopy, Ronald A. Coutu Jr., Ivan R. Medvedev, Douglas T. Petkie
Improved Sensitivity Mems Cantilever Sensor For Terahertz Photoacoustic Spectroscopy, Ronald A. Coutu Jr., Ivan R. Medvedev, Douglas T. Petkie
Faculty Publications
In this paper, a microelectromechanical system (MEMS) cantilever sensor was designed, modeled and fabricated to measure the terahertz (THz) radiation induced photoacoustic (PA) response of gases under low vacuum conditions. This work vastly improves cantilever sensitivity over previous efforts, by reducing internal beam stresses, minimizing out of plane beam curvature and optimizing beam damping. In addition, fabrication yield was improved by approximately 50% by filleting the cantilever’s anchor and free end to help reduce high stress areas that occurred during device fabrication and processing. All of the cantilever sensors were fabricated using silicon-on-insulator (SOI) wafers and tested in a custom …
System And Method For Identifying Electrical Properties Of Integrate Circuits, Mary Y. Lanzerotti
System And Method For Identifying Electrical Properties Of Integrate Circuits, Mary Y. Lanzerotti
AFIT Patents
A new method for displaying electrical properties for integrated circuit (IC) layout designs provides for improved human visualization of those properties and comparison of as designed layout design parameters to as specified layout design parameters and to as manufactured layout parameters. The method starts with a circuitry as designed layout in a first digital format, extracts values for electrical properties from that circuitry as designed layout then annotates those values back into the first digital format. The annotated circuitry as designed layout is then converted from the first digital format to a second digital format that can be converted to …