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Missouri University of Science and Technology

2010

Electric Network Analysis

Articles 1 - 2 of 2

Full-Text Articles in Engineering

Standby Leakage Power Reduction Technique For Nanoscale Cmos Vlsi Systems, Heungjun Jeon, Yong-Bin Kim, Minsu Choi May 2010

Standby Leakage Power Reduction Technique For Nanoscale Cmos Vlsi Systems, Heungjun Jeon, Yong-Bin Kim, Minsu Choi

Electrical and Computer Engineering Faculty Research & Creative Works

In this paper, a novel low-power design technique is proposed to minimize the standby leakage power in nanoscale CMOS very large scale integration (VLSI) systems by generating the adaptive optimal reverse body-bias voltage. The adaptive optimal body-bias voltage is generated from the proposed leakage monitoring circuit, which compares the subthreshold current (ISUB) and the band-to-band tunneling (BTBT) current (IBTBT). The proposed circuit was simulated in HSPICE using 32-nm bulk CMOS technology and evaluated using ISCAS85 benchmark circuits at different operating temperatures (ranging from 25°C to 100°C). Analysis of the results shows a maximum of 551 and …


Novel And Simple High-Frequency Single-Port Vector Network Analyzer, Mohamed A. Abou-Khousa, Mark A. Baumgartner, Sergey Kharkovsky, R. Zoughi Mar 2010

Novel And Simple High-Frequency Single-Port Vector Network Analyzer, Mohamed A. Abou-Khousa, Mark A. Baumgartner, Sergey Kharkovsky, R. Zoughi

Electrical and Computer Engineering Faculty Research & Creative Works

Portable, accurate, and relatively inexpensive high-frequency vector network analyzers (VNAs) have great utility for a wide range of applications, encompassing microwave circuit characterization, reflectometry, imaging, material characterization, and nondestructive testing to name a few. To meet the rising demand for VNAs possessing the aforementioned attributes, we present a novel and simple VNA design based on a standing-wave probing device and an electronically controllable phase shifter. The phase shifter is inserted between a device under test (DUT) and a standing-wave probing device. The complex reflection coefficient of the DUT is then obtained from multiple standing-wave voltage measurements taken for several different …