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Full-Text Articles in Engineering
Design And Perspective Of Amorphous Metal Nanoparticles From Laser Synthesis And Processing, Shun-Xing Liang, Lai-Chang Zhang, Sven Reichenberger, Stephan Barcikowski
Design And Perspective Of Amorphous Metal Nanoparticles From Laser Synthesis And Processing, Shun-Xing Liang, Lai-Chang Zhang, Sven Reichenberger, Stephan Barcikowski
Research outputs 2014 to 2021
Amorphous metal nanoparticles (A-NPs) have aroused great interest in their structural disordering nature and combined downsizing strategies (e.g. nanoscaling), both of which are beneficial for highly strengthened properties compared to their crystalline counterparts. Conventional synthesis strategies easily induce product contamination and/or size limitations, which largely narrow their applications. In recent years, laser ablation in liquid (LAL) and laser fragmentation in liquid (LFL) as "green"and scalable colloid synthesis methodologies have attracted extensive enthusiasm in the production of ultrapure crystalline NPs, while they also show promising potential for the production of A-NPs. Yet, the amorphization in such methods still lacks sufficient rules …
Oscillation Built-In-Self-Test For Adc Linearity Testing In Deep Submicron Cmos Technology, Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong, Adam Osseiran
Oscillation Built-In-Self-Test For Adc Linearity Testing In Deep Submicron Cmos Technology, Koay Soon Chan, Nuzrul Fahmi Nordin, Kim Chon Chan, Terk Zyou Lok, Chee Wai Yong, Adam Osseiran
Research outputs 2013
This paper proposes an Oscillation BIST (OBIST) that is meant to test ADCs fabricated in sub 100nm processes. The design is intended to be capable of testing a 10-bit ADC that was designed in 40nm CMOS. The design scheme presents a simple analog stimulus generator that was designed in 40nm CMOS together with schematic based simulation results. There is also a description of a calibration circuit and a highlevel implementation of a BIST control system to run the BIST and to calculate static parameters such as Differential Non-linearity (DNL) and Integral Non-linearity (INL). Simulation results for the analog stimulus generator …