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Engineered Surfaces To Control Secondary Electron Yield For Multipactor Suppression, James M. Sattler
Engineered Surfaces To Control Secondary Electron Yield For Multipactor Suppression, James M. Sattler
Theses and Dissertations
A significant problem for satellites, vacuum electron devices, and particle accelerators is multipactor: an avalanche of electrons caused by recurring secondary electron emission (SEE) in a time-varying electric field. The consequences of multipactor range from temporary to permanent device failure. This research studied how surface topography can be engineered to minimize SEE and suppress multipactor. Two new semi-empirical models (one based on a 2D pore, the other based on a 3D pore) were developed to predict the secondary electron yield (SEY) of a porous surface based on pore aspect ratio and porosity. The models were validated with experimental SEY measurements …
Modeling Micro-Porous Surfaces For Secondary Electron Emission Control To Suppress Multipactor, James M. Sattler, Ronald Coutu Jr., Robert A. Lake, Tod V. Laurvick, Tyson C. Back, Steven. B. Fairchild
Modeling Micro-Porous Surfaces For Secondary Electron Emission Control To Suppress Multipactor, James M. Sattler, Ronald Coutu Jr., Robert A. Lake, Tod V. Laurvick, Tyson C. Back, Steven. B. Fairchild
Faculty Publications
This work seeks to understand how the topography of a surface can be engineered to control secondary electron emission (SEE) for multipactor suppression. Two unique, semi-empirical models for the secondary electron yield (SEY) of a micro-porous surface are derived and compared. The first model is based on a two-dimensional (2D) pore geometry. The second model is based on a three-dimensional (3D) pore geometry. The SEY of both models is shown to depend on two categories of surface parameters: chemistry and topography. An important parameter in these models is the probability of electron emissions to escape the surface pores. This probability …