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VLSI and Circuits, Embedded and Hardware Systems

Masters Theses

Theses/Dissertations

Automation

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Analog Testing, Characterization, And Low-Order Model Extraction Using Labview Automation, Jeremy Brantley Aug 2012

Analog Testing, Characterization, And Low-Order Model Extraction Using Labview Automation, Jeremy Brantley

Masters Theses

Testing circuits is a hands-on, time intensive process; it is also one of the most important steps in a design cycle. The most well designed circuit is only an academic exercise if it does not work in real life. The time and cost associated with bench level testing pales in comparison to testing for extreme environments. Testing in extreme heat, cold or radiation introduces a large set of challenges that are rarely encountered in standard bench level testing. The two most pronounced problems are the inaccessibility of the devices under test and time constraints, both short and protracted. Due to …