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Solar Cell Potential Induced Degradation Sensor, Luc Alexandre Tousignant

Materials Engineering

It is important to maintain Photovoltaic (PV) cells and protect them from damage mechanisms like Potential Induced Degradation (PID), which can contribute to shorter lifespans and lower efficiencies. Current leakage through cell encapsulation can cause charge migration in PV cells that reduces the maximum quantum efficiency, which is the cause of PID. An experiment was setup to determine the feasibility of a non-silicon sensor able to produce similar leakage behavior to traditional PV cells under recorded humidity conditions. Thin sheet metals were encapsulated in EVA, a common PV encapsulant polymer, and mounted in aluminum framing. Three sensors, along with a …