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Image Stitching And Matching Tool In The Automated Iterative Reverse Engineer (Aire) Integrated Circuit Analysis Suite, David C. Bowman
Image Stitching And Matching Tool In The Automated Iterative Reverse Engineer (Aire) Integrated Circuit Analysis Suite, David C. Bowman
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Due to current market forces, leading-edge semiconductor fabrication plants have moved outside of the US. While this is not a problem at first glance, when it comes to security-sensitive applications, over-production, device cloning, or design alteration becomes a possibility. Since these vulnerabilities exist during the fabrication phase, a Reverse Engineering (RE) step must be introduced to help ensure secure device operation. This thesis proposes several unique methods and a collection of tools to ensure trust assurance in integrated circuit design by detecting fabrication flaws and possible hardware Trojans using several image processing techniques; fused into a singular view of the …