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Anderson-Darling And Cramer-Von Mises Based Goodness-Of-Fit Tests For The Weibull Distribution With Known Shape Using Normalized Spacings, Eric W. Frisco
Anderson-Darling And Cramer-Von Mises Based Goodness-Of-Fit Tests For The Weibull Distribution With Known Shape Using Normalized Spacings, Eric W. Frisco
Theses and Dissertations
Two new goodness-of-fit tests are developed for the three-parameter Weibull distribution with known shape parameter. These procedures eliminate the need for estimating the unknown location and scale parameters prior to initiating the tests and are easily adapted for censored data. This is accomplished by employing the Anderson-Darling and Cramer-von Mises statistics based on the normalized spacings of the sample data. Critical values of the new tests are obtained for common significance levels by large Monte Carlo simulations for shapes 0.5(0.5)4.0 and sample sizes 5(5)40 with up to 40% censoring (Type II) from the left and/or right. An extensive Monte Carlo …
A New Sequential Goodness Of Fit Test For The Three-Parameter Weibull Distribution With Known Shape Based On Skewness And Kurtosis, Jonathan C. Clough
A New Sequential Goodness Of Fit Test For The Three-Parameter Weibull Distribution With Known Shape Based On Skewness And Kurtosis, Jonathan C. Clough
Theses and Dissertations
The Weibull distribution finds wide applicability across a broad spectrum of disciplines and is very prevalent in reliability theory. Consequently, numerous statistical tests have been developed to determine whether sample data can be adequately modeled with this distribution. Unfortunately, the majority of these goodness-of-fit tests involve a substantial degree of computational complexity. The study presented here develops and evaluates a new sequential goodness-of-fit test for the three-parameter Weibull distribution with a known shape that delivers power comparable to popular procedures while dramatically reducing computational requirements. The new procedure consists of two distinct tests, using only the sample skewness and sample …