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Full-Text Articles in Engineering
One-Dimensional Lateral Force Anisotropy At The Atomic Scale In Sliding Single Molecules On A Surface, Yuan Zhang, Daniel J. Trainer, Badri Narayanan, Yang Li, Anh T. Ngo, Sushila Khadka, Arnab Neogi, Brandon Fisher, Larry A. Curtiss, Subramanian K.R.S. Sankaranarayanan, Saw Wai Hla
One-Dimensional Lateral Force Anisotropy At The Atomic Scale In Sliding Single Molecules On A Surface, Yuan Zhang, Daniel J. Trainer, Badri Narayanan, Yang Li, Anh T. Ngo, Sushila Khadka, Arnab Neogi, Brandon Fisher, Larry A. Curtiss, Subramanian K.R.S. Sankaranarayanan, Saw Wai Hla
Physics Faculty Publications
Using a q+ atomic force microscopy at low temperature, a sexiphenyl molecule is slid across an atomically flat Ag(111) surface along the direction parallel to its molecular axis and sideways to the axis. Despite identical contact area and underlying surface geometry, the lateral force required to move the molecule in the direction parallel to its molecular axis is found to be about half of that required to move it sideways. The origin of the lateral force anisotropy observed here is traced to the one-dimensional shape of the molecule, which is further confirmed by molecular dynamics simulations. We also demonstrate that …
Optimization Of Protein-Protein Interaction Measurements For Drug Discovery Using Afm Force Spectroscopy, Yongliang Yang, Bixi Zeng, Zhiyong Sun, Amir Monemianesfahani, Jing Hou, Nian-Dong Jiao, Lianqing Liu, Liangliang Chen, Marc D. Basson, Lixin Dong, Ruiguo Yang, Ning Xi
Optimization Of Protein-Protein Interaction Measurements For Drug Discovery Using Afm Force Spectroscopy, Yongliang Yang, Bixi Zeng, Zhiyong Sun, Amir Monemianesfahani, Jing Hou, Nian-Dong Jiao, Lianqing Liu, Liangliang Chen, Marc D. Basson, Lixin Dong, Ruiguo Yang, Ning Xi
Department of Mechanical and Materials Engineering: Faculty Publications
Increasingly targeted in drug discovery, protein-protein interactions challenge current high throughput screening technologies in the pharmaceutical industry. Developing an effective and efficient method for screening small molecules or compounds is critical to accelerate the discovery of ligands for enzymes, receptors and other pharmaceutical targets. Here, we report developments of methods to increase the signal-to-noise ratio (SNR) for screening protein-protein interactions using atomic force microscopy (AFM) force spectroscopy. We have demonstrated the effectiveness of these developments on detecting the binding process between focal adhesion kinases (FAK) with protein kinase B (Akt1), which is a target for potential cancer drugs. These developments …
Note: Thermal Analog To Atomic Force Microscopy Force-Displacement Measurements For Nanoscale Interfacial Contact Resistance, Brian D. Iverson, John E. Blendell, Suresh V. Garimella
Note: Thermal Analog To Atomic Force Microscopy Force-Displacement Measurements For Nanoscale Interfacial Contact Resistance, Brian D. Iverson, John E. Blendell, Suresh V. Garimella
Faculty Publications
Thermal diffusion measurements on polymethylmethacrylate-coated Si substrates using heated atomic force microscopy tips were performed to determine the contact resistance between an organic thin film and Si. The measurement methodology presented demonstrates how the thermal contrast signal obtained during a force-displacement ramp is used to quantify the resistance to heat transfer through an internal interface. The results also delineate the interrogation thickness beyond which thermal diffusion in the organic thin film is not affected appreciably by the underlying substrate.
Strain Energy And Lateral Friction Force Distributions Of Carbon Nanotubes Manipulated Into Shapes By Atomic Force Microscopy, Mark C. Strus, Roya R. Lahiji, Pablo Ares, Vincente Lopez, Arvind Raman, Ron R. Reifenberger
Strain Energy And Lateral Friction Force Distributions Of Carbon Nanotubes Manipulated Into Shapes By Atomic Force Microscopy, Mark C. Strus, Roya R. Lahiji, Pablo Ares, Vincente Lopez, Arvind Raman, Ron R. Reifenberger
Other Nanotechnology Publications
The interplay between local mechanical strain energy and lateral frictional forces determines the shape of carbon nanotubes on substrates. In turn, because of its nanometer-size diameter, the shape of a carbon nanotube strongly influences its local electronic, chemical, and mechanical properties. Few, if any, methods exist for resolving the strain energy and static frictional forces along the length of a deformed nanotube supported on a substrate. We present a method using nonlinear elastic rod theory in which we compute the flexural strain energy and static frictional forces along the length of single walled carbon nanotubes (SWCNTs) manipulated into various shapes …
Nanoindentation Of The A And C Domains In A Tetragonal Batio3 Single Crystal, Young-Bae Park, Matthew J. Dicken, Zhi-Hui Xu, Xiaodong Li
Nanoindentation Of The A And C Domains In A Tetragonal Batio3 Single Crystal, Young-Bae Park, Matthew J. Dicken, Zhi-Hui Xu, Xiaodong Li
Faculty Publications
Nanoindentation in conjunction with piezoresponse force microscopy was used to study domain switching and to measure the mechanical properties of individual ferroelectric domains in a tetragonal BaTiO3 single crystal. It was found that nanoindentation has induced local domain switching; the a and c domains of BaTiO3 have different elastic moduli but similar hardness.Nanoindentationmodulus mapping on the a and c domains further confirmed such difference in elasticity. Finite element modeling was used to simulate the von Mises stress and plastic strain profiles of the indentations on both a and c domains, which introduces a much higher stress level than …
Elastic Modulus Of Amorphous Sio2 Nanowires, Hai Ni, Xiaodong Li, Hongsheng Gao
Elastic Modulus Of Amorphous Sio2 Nanowires, Hai Ni, Xiaodong Li, Hongsheng Gao
Faculty Publications
Amorphous SiO2 nanowires with diameter ranging from 50 to 100 nm were synthesized using chemical vapor deposition(CVD) under an argon atmosphere at atmospheric pressure. Nanoscale three-point bending tests were performed directly on individual amorphous SiO2 nanowires using an atomic force microscope (AFM).Elastic modulus of the amorphous SiO2 nanowires was measured to be 76.6±7.2GPa, which is close to the reported value of the bulk SiO2 and thermally grown SiO2 thin films, but lower than that of plasma-enhanced CVD SiO2 thin films. The amorphous SiO2 nanowires exhibit brittle fracture failure in bending.
Top-Down Structure And Device Fabrication Using In Situ Nanomachining, Xiaodong Li, Xinnan Wang, Qihua Xiong, Peter C. Eklund
Top-Down Structure And Device Fabrication Using In Situ Nanomachining, Xiaodong Li, Xinnan Wang, Qihua Xiong, Peter C. Eklund
Faculty Publications
We demonstrate the potential of an alternative tool for the fabrication of nanoscale structures and devices. A nanoindenter integrated with an atomic force microscope is shown to be a powerful machine tool for cutting precise length nanowires or nanobelts and for manipulating the shortened wires. We also demonstrate its utility in cutting grooves and fabricating dents (or periodic arrays of dents) in ZnSnanobelts. This approach permits the direct mechanical machining of nanodevices that are supported on a substrate without the inherent complications of e beam or photolithography.
Structural Characterization Of Aluminum Films Deposited On Sputtered-Titanium Nitride/ Silicon Substrate By Metalorganic Chemical Vapor Deposition From Dimethylethylamine Alane, Xiaodong Li, Byoung-Youp Kim, Shi-Woo Rhee
Structural Characterization Of Aluminum Films Deposited On Sputtered-Titanium Nitride/ Silicon Substrate By Metalorganic Chemical Vapor Deposition From Dimethylethylamine Alane, Xiaodong Li, Byoung-Youp Kim, Shi-Woo Rhee
Faculty Publications
Alfilmsdeposited on sputtered‐TiN/Si substrate by metalorganic chemical vapor deposition(MOCVD) from dimethylethylamine alane (DMEAA) were characterized using x‐ray diffraction(XRD),Auger electron spectroscopy(AES),atomic force microscopy(AFM), and transmission electron microscopy (TEM). The TiN filmsputtered on the Si has a preferred orientation along the growth direction with the 〈111〉 of the film parallel to the Si〈111〉. Sputtering of the TiN film on the Si induced strains at the interface. The TiN/Si interface is flat while the Al/TiN interface is rough. There exist many dislocations at the Al/TiN interface. The Al2O3 phase was formed at the Al/TiN interface during the early stages of …