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Electrical and Computer Engineering

Modeling

Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research

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Full-Text Articles in Engineering

Fabrication And Modeling Of Electrochemical Double-Layer Capacitors Using Carbon Nano-Onion Electrode Structures, Fabio Parigi Jul 2013

Fabrication And Modeling Of Electrochemical Double-Layer Capacitors Using Carbon Nano-Onion Electrode Structures, Fabio Parigi

Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research

Electrochemical capacitors or ultracapacitors (UCs) that are commercially available today overcome battery limitations in terms of charging time (from tens of minutes to seconds) and limited lifetime (from a few thousand cycles up to more than one million) but still lack specific energy and energy density (2-5% of a lithium ion battery). The latest innovations in carbon nanomaterials, such as carbon nanotubes as an active electrode material for UCs, can provide up to five times as much energy and deliver up to seven times more power than today’s activated carbon electrodes. Further improvements in UC power density have been achieved …


Modeling Of Power Semiconductor Devices, Tanya Kirilova Gachovska Aug 2012

Modeling Of Power Semiconductor Devices, Tanya Kirilova Gachovska

Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research

One of the requirements for choosing a proper power electronic device for a converter is that it must possess a low specific on-resistance. The specific on-resistance of a bipolar device is related to the base width and doping concentration of the lightly doped drift region. This means that the doping concentration and the width of the low-doped base region in a bipolar device must be carefully considered to achieve a desired avalanche breakdown voltage and on-resistance. In order to determine the technological parameters of a semiconductor device, a one dimensional analysis is used to calculate the minimum depletion layer width, …