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Full-Text Articles in Engineering
An Ultralow Power, 0.003-Mm$^{2}$ Area, Voltage To Frequency-Based Smart Temperature Sensor For -55 $^{\Circ}$C To +125 $^{\Circ}$C With One-Point Calibration, Mudasir Bashir, Sreehari Rao Patri, Krishnaprasad Ksr
An Ultralow Power, 0.003-Mm$^{2}$ Area, Voltage To Frequency-Based Smart Temperature Sensor For -55 $^{\Circ}$C To +125 $^{\Circ}$C With One-Point Calibration, Mudasir Bashir, Sreehari Rao Patri, Krishnaprasad Ksr
Turkish Journal of Electrical Engineering and Computer Sciences
With the scaling of transistor feature size and increased integration density, power density has increased, resulting in high chip temperature, thus degrading the performance and lifetime of the chip. In this work, an ultralow power smart temperature sensor employing a frequency locked loop technique is developed in 65 nm standard CMOS process. The circuit works on the principle of voltage to frequency conversion, exploiting the thermal dependency of threshold voltage (V$_{th})$ of MOS transistors in the subthreshold region. The sensor along with signal conditioning subcircuits has a low power consumption of 1.92 $\mu $W, while operating over -55 $^{\circ}$C to …
Low-Power Voltage To A Frequency-Based Smart Temperature Sensor With +0.8/-0.75 $^{\Circ}$C Accuracy For -55 $^{\Circ}$C To 125 $^{\Circ}$C, Mudasir Bashir, Sreehari Rao Patri, Krishna Prasad
Low-Power Voltage To A Frequency-Based Smart Temperature Sensor With +0.8/-0.75 $^{\Circ}$C Accuracy For -55 $^{\Circ}$C To 125 $^{\Circ}$C, Mudasir Bashir, Sreehari Rao Patri, Krishna Prasad
Turkish Journal of Electrical Engineering and Computer Sciences
The high power densities in system-on-chips demand accurate, low power, and compact smart temperatures for thermal monitoring. In this paper, a low-power CMOS-based smart temperature sensor, operating in the subthreshold region, for military applications (-55 $^{\circ}$C to 125 $^{\circ}$C) is presented. The sensor exploits the thermal dependency of the threshold voltage of MOS transistors to generate a voltage proportional to absolute temperature ($V_{PTAT})$. A frequency locked loop technique is employed to generate frequency from $V_{PTAT}$. The frequency variation due to temperature is measured by counting the rising edge with an asynchronous 12-bit counter. The large die area and requirement of …
Characterization Of A Total Power Radiometer, Murat Celep, Şenel Yaran, Yakup Gülmez, Ari̇f Dolma
Characterization Of A Total Power Radiometer, Murat Celep, Şenel Yaran, Yakup Gülmez, Ari̇f Dolma
Turkish Journal of Electrical Engineering and Computer Sciences
The performance parameters of a total power radiometer designed as a noise measurement system for the frequency range of 12-18 GHz were investigated. The total power radiometer included a low-noise radio frequency section, a narrow-band intermediate frequency section, an average power detector, and a symmetric microwave switch. The radiometer's stability versus time was 0.343 \times 10^{-5} mW/h and its stability against temperature fluctuation was 0.0035 mW/K. The temperature fluctuation of the radiometer was less than 4 mK. We proved that there was no need for active temperature control to obtain stable radiometer gain.
Electromagnetic Engineering In The 21^{St} Century: Challenges And Perspectives, Leopold B. Felsen, Levent Sevgi̇
Electromagnetic Engineering In The 21^{St} Century: Challenges And Perspectives, Leopold B. Felsen, Levent Sevgi̇
Turkish Journal of Electrical Engineering and Computer Sciences
This paper aims at a broad-brush look at certain technological and educational challenges that confront wave-oriented electromagnetic (EM) engineering in the 21^{st} century, in a complex computer and technology-driven world with rapidly shifting societal and technical priorities. Simulation strategies for complex EM systems, both analytic and numerical, are reviewed and categorized, and are illustrated on selected practical complex multicomponent system scenarios currently under investigation in Turkey. Educational issues to ensure proper multidisciplinary exposure of new generations of computer-weaned students, who will have to deal with these problems, are touched upon as well.