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Visible-Ultraviolet Spectroscopic Ellipsometry Of Lead Zirconate Titanate Thin Films, Hosun Lee, Youn Seon Kang, Sang-Jun Cho, Bo Xiao, Hadis Morkoç, Tae Dong Kang
Visible-Ultraviolet Spectroscopic Ellipsometry Of Lead Zirconate Titanate Thin Films, Hosun Lee, Youn Seon Kang, Sang-Jun Cho, Bo Xiao, Hadis Morkoç, Tae Dong Kang
Electrical and Computer Engineering Publications
We measured pseudodielectric functions in the visible-ultraviolet spectral range of Pb(ZrxTi1−x)O3 (x=0.2, 0.56, 0.82) (PZT)grown on platinized silicon substrate using the sol-gel method and also on (0001) sapphire using radio frequency sputtering method. Using a parametric optical constant model, we estimated the dielectric functions of the PZTthin films. Taking the second derivative of the fitted layer dielectric functions and using the standard critical point model, we determined the parameters of the critical points. In the second derivative spectra, the lowest bandgap energy peak near 4eV is fitted as a double peak for annealedPZTs associated with the perovskite phase. As-grown PZTs …
Dielectric Functions And Electronic Band Structure Of Lead Zirconate Titanate Thin Films, Hosun Lee, Youn Seon Kang, Sang-Jun Cho, Bo Xiao, Hadis Morkoç, Tae Dong Kang, Ghil Soo Lee, Jingbo Li, Su-Huai Wei, P. G. Snyder, J. T. Evans
Dielectric Functions And Electronic Band Structure Of Lead Zirconate Titanate Thin Films, Hosun Lee, Youn Seon Kang, Sang-Jun Cho, Bo Xiao, Hadis Morkoç, Tae Dong Kang, Ghil Soo Lee, Jingbo Li, Su-Huai Wei, P. G. Snyder, J. T. Evans
Electrical and Computer Engineering Publications
We measure pseudodielectric functions in the visible-deep ultraviolet spectral range of Pb(ZrxTi1−x)O3 (x=0.2,0.56,0.82) (PZT), Pb0.98Nb0.04 (Zr0.2Ti0.8)0.96O3, Pb0.91La0.09 (Zr0.65Ti0.35)0.98O3, and Pb0.85La0.15Ti0.96O3 films grown on platinized silicon substrates using a sol-gel method and on (0001) sapphire using a radio-frequency sputtering method. Using a parametric optical constant model, we estimate the dielectric functions(ϵ) of the perovskite oxide thin films. Taking the second derivative of the fitted layer dielectric functions and using the standard critical-point model, we determine the parameters of the critical points. In the second derivative spectra, the lowest band-gapenergy peak near 4 eVis fitted as a double peak for annealed PZTs …