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Electrical and Computer Engineering
Electrical and Computer Engineering Faculty Research & Creative Works
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Full-Text Articles in Engineering
Electrical Material Property Measurements Using A Free-Field, Ultra-Wideband System [Dielectric Measurements], C. A. Grosvenor, R. Johnk, D. Novotny, S. Canales, J. Baker-Jarvis, M. Janezic, James L. Drewniak, Marina Koledintseva, Jianmin Zhang, Poorna Chander Ravva
Electrical Material Property Measurements Using A Free-Field, Ultra-Wideband System [Dielectric Measurements], C. A. Grosvenor, R. Johnk, D. Novotny, S. Canales, J. Baker-Jarvis, M. Janezic, James L. Drewniak, Marina Koledintseva, Jianmin Zhang, Poorna Chander Ravva
Electrical and Computer Engineering Faculty Research & Creative Works
We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.
Effects Of Open Stubs Associated With Plated Through-Hole Vias In Backpanel Designs, Shaowei Deng, Jingkun Mao, Todd H. Hubing, James L. Drewniak, Jun Fan, James L. Knighten, Norman W. Smith, Ray Alexander, Chen Wang
Effects Of Open Stubs Associated With Plated Through-Hole Vias In Backpanel Designs, Shaowei Deng, Jingkun Mao, Todd H. Hubing, James L. Drewniak, Jun Fan, James L. Knighten, Norman W. Smith, Ray Alexander, Chen Wang
Electrical and Computer Engineering Faculty Research & Creative Works
Plated through-hole (PTH) vias are commonly used in printed circuit boards. They usually leave open stubs if the signal(s) does not transition the entire depth of the board. These open stubs can have a negative impact on signal transmission. This summary reports the investigation of the impact of the open via stubs in a typical backpanel design.
Determination Of The Thickness And Dielectric Constant Of A Dielectric Slab Backed By Free-Space Or A Conductor Through Inversion Of The Reflection Coefficient Of A Rectangular Waveguide Probe, Jesse Lai, Dana M. Hughes, Eric Gallaher, R. Zoughi
Determination Of The Thickness And Dielectric Constant Of A Dielectric Slab Backed By Free-Space Or A Conductor Through Inversion Of The Reflection Coefficient Of A Rectangular Waveguide Probe, Jesse Lai, Dana M. Hughes, Eric Gallaher, R. Zoughi
Electrical and Computer Engineering Faculty Research & Creative Works
Evaluation of thickness and material properties of coatings and dielectric slabs is an important practical issue. Microwave nondestructive testing techniques, using open-ended rectangular waveguide and coaxial probes have shown great potential for this purpose. However, to evaluate one parameter requires that the other be known a priori. This paper discusses the use of a relatively efficient method for evaluating both parameters simultaneously from measurements of the reflection coefficient of a test material. Results of two cases as well as a brief discussion of the limitations of the technique are provided in this paper.
Determination Of Dielectric Property Profile In Cement-Based Materials Using Microwave Reflection And Transmission Properties, Bharath Akuthota, R. Zoughi, K. E. Kurtis
Determination Of Dielectric Property Profile In Cement-Based Materials Using Microwave Reflection And Transmission Properties, Bharath Akuthota, R. Zoughi, K. E. Kurtis
Electrical and Computer Engineering Faculty Research & Creative Works
Microwave characterization methods are effective means for evaluating dielectric properties of materials and correlating them to their important physical, chemical and mechanical properties. For characterization purposes most materials are considered homogeneous and the measurement of their dielectric properties is fairly straightforward. However, certain materials may be considered inhomogeneous in such a way that their dielectric properties vary in a preferred direction within the material. To evaluate the dielectric property profile of these materials an electromagnetic model is necessary that can be used along with their measured reflection and transmission properties. This paper presents the development of such a model which …