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Electrical and Computer Engineering

Electrical and Computer Engineering Faculty Research & Creative Works

2004

Dielectric Materials

Articles 1 - 4 of 4

Full-Text Articles in Engineering

Extraction Of A Spice Via Model From Full-Wave Modeling For Differential Signaling, Shaofeng Luan, Giuseppe Selli, James L. Drewniak, Andrea De Luca, Giulio Antonini, Antonio Orlandi, Antonio Ciccomancini Scogna, Jun Fan, James L. Knighten, Norman W. Smith, Ray Alexander Aug 2004

Extraction Of A Spice Via Model From Full-Wave Modeling For Differential Signaling, Shaofeng Luan, Giuseppe Selli, James L. Drewniak, Andrea De Luca, Giulio Antonini, Antonio Orlandi, Antonio Ciccomancini Scogna, Jun Fan, James L. Knighten, Norman W. Smith, Ray Alexander

Electrical and Computer Engineering Faculty Research & Creative Works

This paper presents a procedure for building SPICE models for via transitions in differential signaling. The method of extracting parameters of SPICE models from a full-wave simulation tool is demonstrated. Then the validity of the SPICE models is studied by comparing the solution from the SPICE models with that from the full-wave simulation.


Effects Of Open Stubs Associated With Plated Through-Hole Vias In Backpanel Designs, Shaowei Deng, Jingkun Mao, Todd H. Hubing, James L. Drewniak, Jun Fan, James L. Knighten, Norman W. Smith, Ray Alexander, Chen Wang Aug 2004

Effects Of Open Stubs Associated With Plated Through-Hole Vias In Backpanel Designs, Shaowei Deng, Jingkun Mao, Todd H. Hubing, James L. Drewniak, Jun Fan, James L. Knighten, Norman W. Smith, Ray Alexander, Chen Wang

Electrical and Computer Engineering Faculty Research & Creative Works

Plated through-hole (PTH) vias are commonly used in printed circuit boards. They usually leave open stubs if the signal(s) does not transition the entire depth of the board. These open stubs can have a negative impact on signal transmission. This summary reports the investigation of the impact of the open via stubs in a typical backpanel design.


Representation Of Permittivity For Multiphase Dielectric Mixtures In Fdtd Modeling, Marina Koledintseva, J. Wu, H. Zhang, James L. Drewniak, Konstantin Rozanov Aug 2004

Representation Of Permittivity For Multiphase Dielectric Mixtures In Fdtd Modeling, Marina Koledintseva, J. Wu, H. Zhang, James L. Drewniak, Konstantin Rozanov

Electrical and Computer Engineering Faculty Research & Creative Works

A simple method of approximating frequency characteristics of composites in a form convenient for time-domain numerical modeling is proposed. The frequency characteristics can be obtained from experiment or calculations based on the Maxwell Garnett mixing formalism. The resultant frequency characteristic might be of a complex shape corresponding to a combination of a number of absorption peaks. The approximation is made by a series of Debye-like terms using a genetic algorithm (GA). This leads to the necessity of taking a number of terms in the approximating series. Every term corresponds to its pole, i.e., the frequency where the maximum loss occurs. …


Determination Of The Thickness And Dielectric Constant Of A Dielectric Slab Backed By Free-Space Or A Conductor Through Inversion Of The Reflection Coefficient Of A Rectangular Waveguide Probe, Jesse Lai, Dana M. Hughes, Eric Gallaher, R. Zoughi May 2004

Determination Of The Thickness And Dielectric Constant Of A Dielectric Slab Backed By Free-Space Or A Conductor Through Inversion Of The Reflection Coefficient Of A Rectangular Waveguide Probe, Jesse Lai, Dana M. Hughes, Eric Gallaher, R. Zoughi

Electrical and Computer Engineering Faculty Research & Creative Works

Evaluation of thickness and material properties of coatings and dielectric slabs is an important practical issue. Microwave nondestructive testing techniques, using open-ended rectangular waveguide and coaxial probes have shown great potential for this purpose. However, to evaluate one parameter requires that the other be known a priori. This paper discusses the use of a relatively efficient method for evaluating both parameters simultaneously from measurements of the reflection coefficient of a test material. Results of two cases as well as a brief discussion of the limitations of the technique are provided in this paper.