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Electrical and Computer Engineering

Electrical and Computer Engineering Faculty Research & Creative Works

Series

2022

De-embedding

Articles 1 - 2 of 2

Full-Text Articles in Engineering

De-Embedding For Coupled Three-Port Devices, Yuandong Guo, Bo Pu, Donghyun Kim, Jun Fan Jan 2022

De-Embedding For Coupled Three-Port Devices, Yuandong Guo, Bo Pu, Donghyun Kim, Jun Fan

Electrical and Computer Engineering Faculty Research & Creative Works

In many applications, the device under test (DUT) is embedded into a test setup. Various de-embedding techniques have been proposed to expose the real electrical behaviors of a DUT, e.g., the traditional thru-reflect-line and short-open-load-thru algorithms, where the T-matrix and its inverse form are adopted in the mathematical process. In the fields of radiofrequency and electromagnetic compatibility, a DUT may have three coupled ports, and the symmetry in the associated S-matrix breaks down, because the numbers of entry and exist ports are not equal, which results in a non-square T-matrix based upon the definitions. Given that the inverse expression of …


Dielectric Loss Tangent Extraction Using Two Single-Ended Striplines Of Different Width, Jiangshuai Li, Yuanzhuo Liu, Liang Liu, Shengxuan Xia, Scott Hinaga, Victor Khilkevich Jan 2022

Dielectric Loss Tangent Extraction Using Two Single-Ended Striplines Of Different Width, Jiangshuai Li, Yuanzhuo Liu, Liang Liu, Shengxuan Xia, Scott Hinaga, Victor Khilkevich

Electrical and Computer Engineering Faculty Research & Creative Works

Frequency-dependent electrical properties of dielectric materials are one of the most important factors for high-speed signal integrity design. Recently a method of accurately measuring the dielectric loss tangent ($\tan \delta$) of differential lines was proposed. By taking into account the ratio between the differential and common mode per-unit-length resistances the surface roughness contribution to the total loss is eliminated and dielectric parameters can be determined. In this article a similar method is applied to a combination of two single-ended lines. To evaluate the accuracy of the extraction, the impact of the de-embedding errors was investigated, which allows to optimize the …