Open Access. Powered by Scholars. Published by Universities.®
Electrical and Computer Engineering
Electrical and Computer Engineering Faculty Publications and Presentations
Articles 1 - 2 of 2
Full-Text Articles in Engineering
Testing A Quantum Computer, Marek Perkowski, Jacob D. Biamonte
Testing A Quantum Computer, Marek Perkowski, Jacob D. Biamonte
Electrical and Computer Engineering Faculty Publications and Presentations
We address the problem of quantum test set generation using measurement from a single basis and the single fault model. Experimental physicists currently test quantum circuits exhaustively, meaning that each n-bit permutative circuit requires ζ x 2n tests to assure functionality, and for an m stage permutative circuit proven not to function properly the current method requires ζ x 2n x m tests as the upper bound for fault localization, where zeta varies with physical implementation. Indeed, the exhaustive methods complexity grows exponentially with the number of qubits, proportionally to the number of stages in a quantum circuit and directly …
Deterministic And Probabilistic Test Generation For Binary And Ternary Quantum Circuits, Sowmya Aligala, Sreecharani Ratakonda, Kiran Narayan, Kanagalakshmi Nagarajan, Martin Lukac, Jacob D. Biamonte, Marek Perkowski
Deterministic And Probabilistic Test Generation For Binary And Ternary Quantum Circuits, Sowmya Aligala, Sreecharani Ratakonda, Kiran Narayan, Kanagalakshmi Nagarajan, Martin Lukac, Jacob D. Biamonte, Marek Perkowski
Electrical and Computer Engineering Faculty Publications and Presentations
It is believed that quantum computing will begin to have an impact around year 2010. Much work is done on physical realization and synthesis of quantum circuits, but nothing so far on the problem of generating tests and localization of faults for such circuits. Even fault models for quantum circuits have been not formulated yet. We propose an approach to test generation for a wide category of fault models of single and multiple faults. It uses deterministic and probabilistic tests to detect faults. A Fault Table is created that includes probabilistic information. If possible, deterministic tests are first selected, while …