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Electrical and Computer Engineering

AFIT Patents

Bistatic radar

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Low Clutter Method For Bistatic Rcs Measurements, Peter J. Collins Feb 2015

Low Clutter Method For Bistatic Rcs Measurements, Peter J. Collins

AFIT Patents

A bistatic radar measurement system is provided having a radar source configured to produce a radio frequency signal. A transmitting antenna is configured to transmit the radio frequency signal toward a target. A receiving antenna is configured to receive a reflected radio frequency signal from the target. A support system is configured to support the receiving antenna. The support system includes a plurality of low scattering dielectric strings configured to orient the receiving antenna.