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Full-Text Articles in Engineering
Epitaxial Growth Of (001)-Oriented Ba0.5sr0.5tio3 Thin Films On A-Plane Sapphire With An Mgo/Zno Bridge Layer, Bo Xiao, Hongrui Liu, Vitaliy Avrutin, Jacob H. Leach, Emmanuel Rowe, Huiyong Liu, Ü. Özgür, Hadis Morkoç, W. Chang, L.M. B. Allredge, S. W. Kirchoefer, J. M. Pond
Epitaxial Growth Of (001)-Oriented Ba0.5sr0.5tio3 Thin Films On A-Plane Sapphire With An Mgo/Zno Bridge Layer, Bo Xiao, Hongrui Liu, Vitaliy Avrutin, Jacob H. Leach, Emmanuel Rowe, Huiyong Liu, Ü. Özgür, Hadis Morkoç, W. Chang, L.M. B. Allredge, S. W. Kirchoefer, J. M. Pond
Electrical and Computer Engineering Publications
High quality (001)-oriented Ba0.5Sr0.5TiO3 (BST) thin films have been grown on a-plane sapphire(112¯0) by rf magnetron sputtering using a double bridge layer consisting of (0001)-oriented ZnO (50 nm) and (001)-oriented MgO (10 nm) prepared by plasma-assisted molecular beam epitaxy. X-ray diffraction revealed the formation of three sets of in-plane BST domains, offset from one another by 30°, which is consistent with the in-plane symmetry of the MgO layer observed by in situ reflective high electron energy diffraction. The in-plane epitaxial relationship of BST, MgO, and ZnO has been determined to be BST [110]//MgO [110]//ZnO [112¯0] and BST [110]/MgO [110]//ZnO [11¯00]. …
Luminescence Properties Of Defects In Gan, Michael A. Reshchikov, Hadis Morkoç
Luminescence Properties Of Defects In Gan, Michael A. Reshchikov, Hadis Morkoç
Electrical and Computer Engineering Publications
Gallium nitride (GaN) and its allied binaries InN and AIN as well as their ternary compounds have gained an unprecedented attention due to their wide-ranging applications encompassing green, blue, violet, and ultraviolet (UV) emitters and detectors (in photon ranges inaccessible by other semiconductors) and high-power amplifiers. However, even the best of the three binaries, GaN, contains many structural and point defects caused to a large extent by lattice and stacking mismatch with substrates. These defects notably affect the electrical and optical properties of the host material and can seriously degrade the performance and reliability of devices made based on these …
A Comprehensive Review Of Zno Materials And Devices, Ü. Özgür, Ya. I. Alivov, C. Liu, A. Teke, M. A. Reshchikov, S. Doğan, Vitaliy Avrutin, S.-J. Cho, H. Morkoç
A Comprehensive Review Of Zno Materials And Devices, Ü. Özgür, Ya. I. Alivov, C. Liu, A. Teke, M. A. Reshchikov, S. Doğan, Vitaliy Avrutin, S.-J. Cho, H. Morkoç
Electrical and Computer Engineering Publications
The semiconductor ZnO has gained substantial interest in the research community in part because of its large exciton binding energy (60 meV) which could lead to lasing action based on exciton recombination even above room temperature. Even though research focusing on ZnO goes back many decades, the renewed interest is fueled by availability of high-quality substrates and reports of p-type conduction and ferromagnetic behavior when doped with transitions metals, both of which remain controversial. It is this renewed interest in ZnO which forms the basis of this review. As mentioned already, ZnO is not new to the semiconductor field, with …
Generation–Recombination Noise In Gallium Nitride-Based Quantum Well Structures, Rolando S. Duran, Grover L. Larkins Jr., Carolyn M. Van Vliet, Hadis Morkoç
Generation–Recombination Noise In Gallium Nitride-Based Quantum Well Structures, Rolando S. Duran, Grover L. Larkins Jr., Carolyn M. Van Vliet, Hadis Morkoç
Electrical and Computer Engineering Publications
Electronic noise has been investigated in AlxGa1−xN/GaN modulation-doped field-effect transistors of submicron dimensions, grown by molecular beam epitaxy techniques. Some 20 devices were grown on a sapphire substrate. Conduction takes place in the quasi-two-dimensional (2D) layer of the junction (xy plane) which is perpendicular to the triangular quantum well (z direction). A nondoped intrinsic buffer layer separates the Si-doped donors in the AlxGa1−xN layer from the 2D transistor plane. Since all contacts must reach through the AlxGa1−xN layer to connect internally to the 2D plane, parallel conduction through this layer is a feature of all modulation-doped devices. The …
Unusual Luminescence Lines In Gan, M. A. Reshchikov, D. Huang, F. Yun, P. Visconti, L. He, H. Morkoç, J. Jasinski, Z. Liliental-Weber, R. J. Molnar, S. S. Park, K. Y. Lee
Unusual Luminescence Lines In Gan, M. A. Reshchikov, D. Huang, F. Yun, P. Visconti, L. He, H. Morkoç, J. Jasinski, Z. Liliental-Weber, R. J. Molnar, S. S. Park, K. Y. Lee
Electrical and Computer Engineering Publications
A series of sharp intense peaks was observed in the low-temperature photoluminescence spectrum of unintentionally doped GaN in the photon energy range between 3.0 and 3.46 eV. We attributed the majority of these peaks to excitons bound to unidentified structural and surface defects. Most of the structural- and surface-related peaks (at 3.21, 3.32, 3.34, 3.35, 3.38, and 3.42 eV) were observed in Ga polar films. In N polar GaN, we often observed the 3.45 eV peak attributed to excitons bound to the inversion domain interfaces.
Contactless Electroreflectance, In The Range Of 20 K < T < 300 K, Of Freestanding Wurtzite Gan Prepared By Hydride-Vapor-Phase Epitaxy, Y. S. Huang, Fred H. Pollak, S. S. Park, K. Y. Lee, H. Morkoç
Contactless Electroreflectance, In The Range Of 20 K < T < 300 K, Of Freestanding Wurtzite Gan Prepared By Hydride-Vapor-Phase Epitaxy, Y. S. Huang, Fred H. Pollak, S. S. Park, K. Y. Lee, H. Morkoç
Electrical and Computer Engineering Publications
We have performed a detailed contactless electroreflectance study of the interband excitonic transitions on both the Ga and N faces of a 200-μm-thick freestanding hydride-vapor-phase-epitaxy grown wurtzite GaN sample with low defect concentration in the temperature range between 20 and 300 K. The transition energies of the A, B, and C excitons and broadening parameters of the A and B excitons have been determined by least-square fits to the first derivative of a Lorentzian line shape. The energy positions and separations of the excitonic transitions in the sample reveal the existence of residual strain. At 20 K the broadening parameter …
Energy Band Bowing Parameter In Alxga1-Xn Alloys, Feng Yun, Michael A. Reshchikov, Lei He, Thomas King, Hadis Morkoç, Steve W. Novak, Luncun Wei
Energy Band Bowing Parameter In Alxga1-Xn Alloys, Feng Yun, Michael A. Reshchikov, Lei He, Thomas King, Hadis Morkoç, Steve W. Novak, Luncun Wei
Electrical and Computer Engineering Publications
Molecular-beam epitaxy grown AlxGa1−xN alloys covering the entire range of alloy compositions, 0⩽x⩽1, have been used to determine the alloy band gap dependence on its composition. The Alchemical composition was deduced from secondary ion mass spectroscopy and Rutherford backscattering. The composition was also inferred from x-ray diffraction. The band gap of the alloy was extracted from low temperature optical reflectance measurements which are relatively more accurate than photoluminescence. Fitting of the band gap data resulted in a bowing parameter of b=1.0 eV over the entire composition range. The improved accuracy of the composition and band gap determination …