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Muller C-Element Based Decoder (Mcd): A Decoder Against Transient Faults, Y. Tang, Chris J. Winstead, C. Jego, E. Boutillon, M. Jezequel

Electrical and Computer Engineering Faculty Publications

This work extends the analysis and application of a digital error correction method called Muller C-element Decoding (MCD), which has been proposed for fault masking in logic circuits comprised of unreliable elements. The proposed technique employs cascaded Muller C-elements and XOR gates to achieve efficient error-correction in the presence of internal upsets. The error-correction analysis of MCD architecture and the investigation of C-element’s robustness are first introduced. We demonstrate that the MCD is able to produce error-correction benefit in a high error-rate of internal faults. Significantly, for a (3,6) short-length LDPC code, when the decoding process is internally error-free the …